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Probe Card - Probe Test (3825-PC)
Probe Card - Probe Test
A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby ...
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ECTFE / Halar®

ECTFE Halar was designed to provide excellent chemical resistance in heavy duty corrosion applications. Meets FM 4910 approval.
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